One of the major part of technological process reliability qualification and reliability monitoring is the measurements of components degradation under different stress conditions. In our laboratory we can do NBTI (Negative Bias Temperature Instability) and HCI (Hot Carrier Injection) measurements on packaged devices in wide temperatures range (up to 175oC) according appropriate JEDEC standards. In-house technological measurements allows us to extract model parameters that are not available in PDK.
In addition to the qualification measurements it is often necessary to control the parameters of such primitive devices as transistor, diodes, resistors, capacitors and etc.
Primitive devices parameters measurements is used for foundry model verification and extraction of the parameters missing in the design kit. We provide full service for primitive devices characterization including test chip design, measurements and model extraction.